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Apr 8, 2016 at 12:11 history edited Euri Pinhollow CC BY-SA 3.0
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Apr 8, 2016 at 12:10 comment added Euri Pinhollow @james-snell: the ADC converter is a bottleneck which gets all the throughput. There are not much more than two unreliable places - the ADC and the flash card, everything else is very complicated and would produce more more complicated errors (RAM is another place which can fail but it is usually broken in non-moving places). If NEF compression is turned on flash card failure cannot produce linear artefacts because compression is usually done in tiles. Therefore, the problem lies in ADC.
Apr 8, 2016 at 8:44 comment added James Snell But the point is that even with that being the case the failure mode still doesn't support the cause in this answer, hence the downvote. The more likely scenario is the one linked by AJ but as the numerous requests for clarification have gone unanswered any answer would be guesswork.
Apr 7, 2016 at 6:23 comment added Euri Pinhollow @james-snell: well, I did not feel like it was required to say so, but what I really wanted to say that there is a failure somewhere in ADC process, be it sensor or the ADC itself.
Apr 6, 2016 at 21:08 comment added James Snell My family ran an electronics repair business doing component level repairs to surface mount gear and pro AV kit when I was a kid, I've been around plenty of dead/poorly IC's to know that the failure of the sensor or a line wouldn't be nearly as inconsistent. Like everyone else I was waiting on more clarification from the OP, this question should be closed really
Apr 6, 2016 at 7:44 comment added Euri Pinhollow @james-snell: "errors like that would be consistently placed." - can you substantiate your statement?
Apr 5, 2016 at 20:58 comment added James Snell downvoted - errors like that would be consistently placed. These errors are not.
Apr 5, 2016 at 13:43 history answered Euri Pinhollow CC BY-SA 3.0